Sample Preparation
Preparing Samples
Sample preparation procedures form part of the methodological spectrum of materialography.
Examining, analyzing, and documenting material microstructures and structures.
Chair

Vice Chair
Sample Preparation
Sample preparation procedures form part of the methodological spectrum of materialography.
Microscopy
Electron microscopy and high-resolution X-ray computed tomography extend the range of methods.
Evaluation
Examination data are analyzed, evaluated, and documented.
Computer-aided data processing and evaluation play an increasingly important role in materialography. Digital and quantitative image analysis, together with machine learning, are among the digital topics relevant to the further development of the discipline.
Physical models for microstructure-property correlations are a further development area, as are the simulation of microstructure formation and the calculation of properties from microstructure.
Conferences
The annual Metallography conferences are among the committee’s responsibilities.
Professional Exchange
Experts meet regularly to exchange views on materialography topics.
Qualification
The committee supports early-career researchers as well as education and continuing professional development.
Materialography is closely connected to the development of materials. As materials are adapted to their conditions of use and new applications are opened up, the equipment and methods used for material characterization also need to evolve. The work ranges from sample preparation and microscopic techniques to the documentation of examination results.
The methodological spectrum includes high-resolution scanning electron microscopy with focused ion beam, atom probe tomography, 3D microscopy, digital image analysis, computer-controlled microscopes, and X-ray microscopy. Automated multiscale 3D microscopy remains an area for further development.
Other focal areas include models for microstructure-property correlations, simulation of microstructure formation, and the calculation of properties from microstructure. These fields require research projects on method development and interdisciplinary project teams that also incorporate IT expertise.