X-Ray Tomography

The Working Group discusses experimental setups in the laboratory and at synchrotron beamlines, both in projection geometry and using focusing optics (X-ray microscopy), as well as concepts for data acquisition, data processing, and data analysis, including the application of machine learning algorithms. In this context, the further development of X-ray computed tomography (XCT), in particular micro-and nano-XCT, for the analysis of 3D morphology and microstructure of materials, is in the focus of the Working Group activities. Resolution, contrast, and the time required for measurement and data analysis ("time-to-data") are important criteria for this. New results from basic research are presented and application-specific solutions in the fields of metallurgy and chemistry, renewable energies, and lightweight construction, as well as microelectronics, are pointed out. Since X-ray tomography is a non-destructive analysis technique, this method is particularly suitable for studying kinetic processes in materials and systems, e.g. in-situ experiments on crack propagation and operando studies of electrochemical processes.