Quantitative 3D-Microscopy of Surfaces

Quantitative 3D microscopy of surfaces includes confocal microscopy, white-light interferometry, profilometry and AFM for precise height measurement and topography reconstruction. Metrics such as roughness, adhesion- and contact-mechanics-related parameters and statistical analyses enable objective surface characterization for research and quality assurance.

Committees

Working Group

Quantitative 3D-Microscopy of Surfaces

Committee members: 70

Chair

Thorsten Dziomba

Physikalisch-Technische Bundesanstalt

Vice Chair

André Felgner

Physikalisch-Technische Bundesanstalt

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