Crystallographic Material Characterization in REM

Crystallographic characterization in the SEM using EBSD provides orientation-resolved maps of grains, grain boundaries and local strain. The technique enables quantification of texture, boundary types and plastic deformation and is central for linking microstructure to properties in metals and ceramics.

Committees

  • Working Group

    Microstructure Characterization in the Scanning Electron Microscope (EBSD)

    Committee members: 10
    Chair
    Prof. Dr. Andreas Leineweber
    TU Bergakademie Freiberg
    Chair
    Dr. Stefan Martin
    TU Bergakademie Freiberg
    Chair
    Prof. Dr. Sandra Korte-Kerzel
    RWTH Aachen University
    Chair
    Lukas Berners (M.Sc.)
    RWTH Aachen University
    Chair
    Dr.-Ing. Hanka Becker
    Otto von Guericke University Magdeburg
    Chair
    Dr. Gert Nolze
    Bundesanstalt für Materialforschung und -prüfung (BAM)

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