Scanning Electron Microscopy in Materials Testing

Scanning electron microscopy in materials testing uses secondary and backscattered electrons plus EDX/EBSD for morphology, composition and crystallography studies. In situ stages enable mechanical, thermal or environmental tests; fracture surface and failure analyses benefit from high resolution and large depth of field.

Committees

  • Working Group

    Fractography

    Committee members: 126
    Chair
    Dr.-Ing. Dirk Bettge
    Bundesanstalt für Materialforschung und -prüfung (BAM)
  • Working Group

    In situ 2D and 3D characterization

    Committee members: 119
    Chair
    PD Dr.-Ing. habil. Anja Weidner
    TU Bergakademie Freiberg
    Vice Chair
    Dr. Enrico Bruder
    Technical University of Darmstadt
  • Working Group

    Microstructure Characterization in the Scanning Electron Microscope (EBSD)

    Committee members: 5
    Chair
    Dr. Gert Nolze
    Bundesanstalt für Materialforschung und -prüfung (BAM)

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