Expert Committee
Materialography

The constant adaptation of materials to their conditions of use as well as the opening up of new applications entails a continuous development of equipment and methods for material characterization. The term material graph covers all methods for the microstructural and structural investigation of materials. This includes sample preparation procedures, a wide variety of microscopic methods including electron microscopy and high-resolution X-ray computed tomography, as well as the analysis, evaluation, and documentation of microscopic examination results. Computer-aided methods of data processing and evaluation are playing an increasingly important role. With its working groups, the Expert Committee Materialography promotes and coordinates the regular exchange among experts with the aim of further developing this important discipline. The organizational and strategic management is carried out by the chairperson and the deputy chairperson, who is supported by the members of the Working Group Coordination in an advisory capacity.

To be able to adapt materials even better to their conditions of use and to open up new applications, methods and equipment used to investigate the microstructure and structure of materials must be continuously developed. Materialography fulfills this task. This includes sample preparation procedures, a wide variety of microscopic methods (including electron microscopy and high-resolution X-ray computed tomography) as well as the analysis, evaluation and documentation of the test results.

In climate protection, but also in the fields of resource efficiency and sustainability, materialography makes important contributions. Last but not least, it serves to secure the competitiveness of industry in a wide variety of fields by further developing the basis of understanding of materials - and thus the prosperity of society and Germany as a business location.

Numerous breakthroughs have been achieved in recent years in the field of high-resolution scanning electron microscopy (SEM) with focused ion beam (FIB), atomic probe tomography and 3D microscopy, but also in digital image analysis and the field of computer-controlled microscopes and X-ray microscopy. Nevertheless, there are still many challenges to be met in the coming years. For example, automated multiscale 3D microscopy for materialography must be further developed, as must those possibilities that can lead to the creation of (physical) models for describing microstructure-property correlations. There is still great potential for research in these areas.

For the further development of materialography, research projects on the subject of method development for important cross-sectional topics are necessary in this framework. For example, to improve microscopic methods or to develop physical models that can be used to calculate properties from chemical composition and microstructure better than before. There is also a great need for research in the simulation of the formation of microstructures and the calculation of properties from the microstructure. To this end, interdisciplinary project teams must be created and, above all, IT expertise must also be integrated.

Goals

  • Organization and responsibility of the annual metallography conferences.

  • Promotion of regular scientific and technical exchange among experts.

  • Promotion of young scientists.

  • Promotion of education and training of materialographers.

  • Further development of materialography in the areas of method development, such as for microscopic procedures and physical models, simulation and modeling, and in digitization topics such as machine learning and quantitative image analysis.

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